두 개의 이상원인을 고려한 vss X 관리도의 통계적 설계

Abstract

In this paper we apply VSS X chart to the case when two assignable causes effect the proess mean shift. We compare the case when two compound assignable causes effect the process mean with another one which effects individually. For the practical use of VSS X chart we propose the sample size which minimizes the average number of samples until the single is given in out-of-control state.