207 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author이승환-
dc.date.accessioned2022-04-04T00:33:36Z-
dc.date.available2022-04-04T00:33:36Z-
dc.date.issued2020-07-
dc.identifier.citationJOURNAL OF MANUFACTURING PROCESSES, v. 55, page. 307-316en_US
dc.identifier.issn1526-6125-
dc.identifier.issn2212-4616-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S1526612520302358?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/169656-
dc.description.abstractIn this study, an in-situ monitoring system was developed using a spectrometer for laser welding on galvanized steel. The spectrometer monitored the emission spectra generated from laser-induced plasma for the purpose of classifying welding defects because the plasma generated during the laser welding process contains a considerable amount of information about the on-going process. Temporal features extracted from the emission spectra were used for in-situ monitoring. In order to extract the best features, Fisher's criterion was adopted to rank and select the features. The monitoring performance of a photodiode and spectrometer were compared by using the selected features. The emission spectrum proved to be a better feature than the photodiode signal. Additionally, the emission spectrum was combined with statistical properties such as mean, root mean square, standard deviation, peak, skewness, and kurtosis to increase the classification rate. The ranking of the emission spectra depended on the statistical features. The k-nearest neighbors (k-NN) algorithm and support vector machine (SVM) algorithm were used as classifiers of the ranked features. Three groups, which are sound welding, underfill defect and bead separation defect, were successfully classified for quality assurance.en_US
dc.description.sponsorshipThis work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea government (MSIT) (No. 2017R1C1B5018334)en_US
dc.language.isoenen_US
dc.publisherELSEVIER SCI LTDen_US
dc.subjectEmission spectroscopyen_US
dc.subjectLaser material processingen_US
dc.subjectFisher’s criterionen_US
dc.subjectK-nearest neighbors (k-NN)en_US
dc.subjectSupport vector machine (SVM)en_US
dc.titleRanked Feature-Based Laser Material Processing Monitoring and Defect Diagnosis Using k-NN and SVMen_US
dc.typeArticleen_US
dc.relation.volume55-
dc.identifier.doi10.1016/j.jmapro.2020.04.015-
dc.relation.page307-316-
dc.relation.journalJOURNAL OF MANUFACTURING PROCESSES-
dc.contributor.googleauthorLee, Seung Hwan-
dc.contributor.googleauthorMazumder, Jyoti-
dc.contributor.googleauthorPark, Jaewoong-
dc.contributor.googleauthorKim, Seokgoo-
dc.relation.code2020050536-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentSCHOOL OF MECHANICAL ENGINEERING-
dc.identifier.pidseunghlee-
dc.identifier.orcidhttps://orcid.org/0000-0002-1509-3348-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MECHANICAL ENGINEERING(기계공학부) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE