Analysis of new interconnection covering top metallization layer for 650V GaN e-HEMT power modules
- Title
- Analysis of new interconnection covering top metallization layer for 650V GaN e-HEMT power modules
- Author
- 윤상원
- Issue Date
- 2020-07
- Publisher
- Mesago Messe Frankfurt GmbH
- Citation
- PCIM Europe digital days 2020, 7 – 8 July 2020, page. 1958-1963
- Abstract
- This paper presents a new interconnection design for power modules. The interconnection has a shaped contact to be fit with the top metal of power semiconductors and is especially designed for GaN e-HEMT devices having a unique top-side metallization layer design and lateral conduction channel. This interconnection can reduce parasitic inductance/resistance and mitigate current density and thermal concentration in power modules. These advantages are validated by finite element method (FEM) simulations. In addition, to accommodate manufacturing inconvenience, an adjusted interconnection shape is also analyzed.
- URI
- https://ieeexplore.ieee.org/document/9178258https://repository.hanyang.ac.kr/handle/20.500.11754/169444
- ISBN
- 978-3-8007-5245-4
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > AUTOMOTIVE ENGINEERING(미래자동차공학과) > Articles
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