Analysis of transient degradation behaviors of organic light-emitting diodes under electrical stress
- Title
- Analysis of transient degradation behaviors of organic light-emitting diodes under electrical stress
- Author
- 신동수
- Keywords
- organic light-emitting diodes; degradation; transient; charge recombination and transport
- Issue Date
- 2021-08
- Publisher
- MDPI
- Citation
- APPLIED SCIENCES-BASEL, v. 11, NO 16, Page. 1-9
- Abstract
- Despite the wide application of organic light-emitting diodes (OLEDs), the performance of OLED devices is sometimes limited by their reliabilities. In this paper, we report the transient degradation behaviors of fluorescent blue OLEDs, where both the current and luminance initially increase under electrical stress within a short stress time. We analyze the degradation mechanism in terms of the carrier recombination and transport. From the comprehensive analyses of electrical and optical characteristics, it is suggested that the electron transport is responsible for the initial transient behavior of the device.
- URI
- https://www.mdpi.com/2076-3417/11/16/7627https://repository.hanyang.ac.kr/handle/20.500.11754/168805
- ISSN
- 20763417
- DOI
- 10.3390/app11167627
- Appears in Collections:
- COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
- Files in This Item:
There are no files associated with this item.
- Export
- RIS (EndNote)
- XLS (Excel)
- XML