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dc.contributor.author박진성-
dc.date.accessioned2021-02-23T02:31:26Z-
dc.date.available2021-02-23T02:31:26Z-
dc.date.issued2020-03-
dc.identifier.citationJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A, v. 38, no. 2, article no. 022411en_US
dc.identifier.issn0734-2101-
dc.identifier.issn1520-8559-
dc.identifier.urihttps://avs.scitation.org/doi/10.1116/1.5134055-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/158882-
dc.description.abstractMolecular layer deposition (MLD) is a thin film technique to make a pure organic coating or hybrid organic–inorganic film, sequentially dosing organic–organic or organic–inorganic precursors, respectively. In this study, hybrid organic–inorganic alucone films were fabricated via MLD using 4-mercaptophenol and trimethylaluminum as organic and metal precursors, respectively, over the deposition temperature range of 100–200 °C. The fabricated film was very stable without degradation when exposed to the atmosphere, and the characteristic change was confirmed through annealing under vacuum at 300–750 °C. After annealing, the thickness of the alucone films decreased and the bonding of the carbon ring changed, as revealed by the spectroscopic ellipsometer, Fourier-transform infrared, Raman, x-ray diffraction, and x-ray photoelectron spectroscopy results. The annealed alucone films showed thermal polymerization, and their carbon ring structures transformed into graphitic carbon flakes. The alucone film annealed at 750 °C showed an electrical resistivity of 0.55 Ω cm. Annealed MLD alucone films, which are hybrid materials, are potential candidates for applications in electronic, capacitor, and thermoelectric devices.en_US
dc.description.sponsorshipThis work was supported by the National Research Foundation of Korea (NRF) grant funded by the Korea Government (No. NRF-2017R1D1A1B03034035) and was supported by the MOTIE (Ministry of Trade, Industry & Energy; Project No. 10080633) and KSRC (Korea Semiconductor Research Consortium) support program for the development of the future semiconductor device.en_US
dc.language.isoenen_US
dc.publisherA V S AMER INST PHYSICSen_US
dc.subjectRAMAN-SPECTROSCOPYen_US
dc.subjectGRAPHENEen_US
dc.subjectGROWTHen_US
dc.subjectCARBONen_US
dc.subjectAL2O3en_US
dc.subjectENCAPSULATIONen_US
dc.subjectPOLYMERen_US
dc.subjectFTIRen_US
dc.subjectNANOCOMPOSITEen_US
dc.subjectFABRICATIONen_US
dc.titleAir-stable alucone thin films deposited by molecular layer deposition using a 4-mercaptophenol organic reactanten_US
dc.typeArticleen_US
dc.relation.no2-
dc.relation.volume38-
dc.identifier.doi10.1116/1.5134055-
dc.relation.page22411-22411-
dc.relation.journalJOURNAL OF VACUUM SCIENCE & TECHNOLOGY A-
dc.contributor.googleauthorBaek, GeonHo-
dc.contributor.googleauthorLee, Seunghwan-
dc.contributor.googleauthorLee, Jung-Hoon-
dc.contributor.googleauthorPark, Jin-Seong-
dc.relation.code2020048759-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidjsparklime-
dc.identifier.orcidhttps://orcid.org/0000-0002-9070-5666-
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COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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