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전류차단층의 기생효과 해석

Title
전류차단층의 기생효과 해석
Author
심종인
Issue Date
2003-02
Publisher
Optical Society of Korea
Citation
한국광학회 제14회 정기총회 및 2003년도 동계학술발표회 논문집, Page.148-149
Abstract
The parasitic effects due to the current blocking layer limit the bandwidth of the semiconductor laser diode. Thus, the parasitic response of various blocking layers was analyzed. The inin type was the best choice for the leakage current reduction and the bandwidth expansion.
URI
http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE00649356https://repository.hanyang.ac.kr/handle/20.500.11754/154909
Appears in Collections:
COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E](과학기술융합대학) > PHOTONICS AND NANOELECTRONICS(나노광전자학과) > Articles
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