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dc.contributor.author김희준-
dc.date.accessioned2020-08-10T06:32:12Z-
dc.date.available2020-08-10T06:32:12Z-
dc.date.issued2004-10-
dc.identifier.citationISOCC 2004 Conference, Page.190-192en_US
dc.identifier.urihttps://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE01810746&language=ko_KR-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/152137-
dc.description.abstractA capacitance deviation-to-time interval converter is presented for interfacing capacitive sensors. It consists of two ramp integrators, two current-tunable Schmitt triggers, and two logic gates. A prototype circuit built using discrete components exhibits a resolution as high as 13 bits and a linearity error less than ±0.2 % when the output pulse is counted by a 20 MHz clock signal. Its application to a humidity sensor is also presented.en_US
dc.language.isoen_USen_US
dc.publisher대한전자공학회en_US
dc.subjectCapacitance measurementen_US
dc.subjectramp integratoren_US
dc.subjecttrigger circuiten_US
dc.subjecthumidity sensoren_US
dc.subjectcapacitive sensoren_US
dc.titleA CAPACITANCE DEVIATION-TO-TIME INTERVAL CONVERTER FOR CAPACITIVE SENSORSen_US
dc.typeArticleen_US
dc.contributor.googleauthorKim, Hoon-
dc.contributor.googleauthorChung, Won-Sup-
dc.contributor.googleauthorKim, Hee-Jun-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidhjkim-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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