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dc.contributor.author심종인-
dc.date.accessioned2020-03-09T07:44:55Z-
dc.date.available2020-03-09T07:44:55Z-
dc.date.issued2004-03-
dc.identifier.citationInternational Symposium on Signals, Circuits and Systems. Proceedings, SCS 2003.en_US
dc.identifier.isbn0-7695-2093-6-
dc.identifier.urihttps://ieeexplore.ieee.org/document/1283697/authors#authors-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/134701-
dc.description.abstractIn today's UDSM(ultra-deep-sub-micron)-process-technology-based ICs, dynamic delay variations of strongly coupled lines (due to neighboring net switching activity) make static timing analysis problematic. In this paper, new analytical timing models for RLC coupled lines are presented and their accuracy is verified. Coupled interconnect lines are decoupled into an effective single line model by using effective capacitances and effective inductances corresponding to switching activity. Their signal transient waveforms of the effective single line models are determined by exploiting the TWA (Traveling-wave-based Waveform Approximation) technique. This is followed by single line analytical timing model development. It is shown that the models have excellent agreement with SPICE simulations for various circuit performance parameters such as line pitch, line length, driver/receiver size, IMD-thickness, and aspect ratio.en_US
dc.language.isoen_USen_US
dc.publisherIEEE COMPUTER SOCIETYen_US
dc.titleAnalytical Dynamic Time Delay Model of Strongly Coupled RLC Interconnect Lines Dependent on Switchingen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/ISQED.2004.1283697-
dc.contributor.googleauthorShin, Seongkyun-
dc.contributor.googleauthorEo, Yungseon-
dc.contributor.googleauthorEisenstadt, William R.-
dc.contributor.googleauthorShim, Jongin-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E]-
dc.sector.departmentDEPARTMENT OF PHOTONICS AND NANOELECTRONICS-
dc.identifier.pidjishim-


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