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dc.contributor.author이성환-
dc.date.accessioned2019-12-10T02:46:58Z-
dc.date.available2019-12-10T02:46:58Z-
dc.date.issued2019-09-
dc.identifier.citationIEEE ACCESS, v. 7, Page. 136783-136791en_US
dc.identifier.issn2169-3536-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8845590-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/120659-
dc.description.abstractIn this study, a novel setup for a nanoscale finishing process - magnetic abrasive finishing (MAF) - was investigated together with in-process monitoring using acoustic emissions (AE). A specially fabricated direction control piece with a neodymium magnet was attached to an MAF setup to perform surface finishing of thin-film (IZO) coated Pyrex glass workpieces within a selective area. For the selective finishing experiments, design of experiment (DOE) was applied to optimize the surface roughness of the workpieces. In addition, an acoustic emission (AE) sensor, which can effectively monitor surface roughness and process states during ultraprecision machining/polishing of nanoscale workpieces, was adopted to detect the depth of the polished surface during MAF. The experimental results show that the proposed MAF setup produces uniform surfaces with nano-level surface roughness in a confined (target) area. Moreover, AE monitoring appears to have strong correlations with process states and sufficient sensitivity to detect the critical thickness (the end point of the coating layer). The processed AE signals were utilized as input parameters for an artificial neural network (ANN) to determine whether the polishing was reached to the coating-substrate (Pyrex) boundary. With the proposed polishing and monitoring scheme, controlled nanofinishing of a thin film coated material are feasible in a selective area within specific thickness/layer.en_US
dc.description.sponsorshipThis work was supported in part by the Basic Science Research Program through the National Research Foundation of Korea (NRF) under Grant NRF-2017R1D1A1B03035551.en_US
dc.language.isoen_USen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectAcoustic emission monitoringen_US
dc.subjectartificial neural networken_US
dc.subjectcoating-substrate boundaryen_US
dc.subjectmagnetic abrasive finishingen_US
dc.subjectselective nano finishingen_US
dc.subjectsurface roughnessen_US
dc.titleSelective magnetic abrasive finishing of nano-thickness IZO-coated Pyrex glass using acoustic emission monitoring and artificial neural networken_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume7-
dc.identifier.doi10.1109/ACCESS.2019.2942689-
dc.relation.page136783-136791-
dc.relation.journalIEEE ACCESS-
dc.contributor.googleauthorKim, J.-
dc.contributor.googleauthorKim, H.-
dc.contributor.googleauthorLee, S.H.-
dc.relation.code2019036307-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MECHANICAL ENGINEERING-
dc.identifier.pidsunglee-


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