Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 배석주 | - |
dc.date.accessioned | 2019-12-06T00:31:12Z | - |
dc.date.available | 2019-12-06T00:31:12Z | - |
dc.date.issued | 2018-03 | - |
dc.identifier.citation | RELIABILITY ENGINEERING & SYSTEM SAFETY, v. 170, page. 244-256 | en_US |
dc.identifier.issn | 0951-8320 | - |
dc.identifier.issn | 1879-0836 | - |
dc.identifier.uri | https://www.sciencedirect.com/science/article/pii/S095183201730265X?via%3Dihub | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/117761 | - |
dc.description.abstract | In degradation test of some products such as plasma display panels (PDPs) and organic light emitting diodes (OLEDs), observed degradation paths tend to exhibit two-phase patterns over testing period. In this paper, we propose a change-point Wiener process (CPWP) model to fit the degradation paths with two-phase pattern mainly in a Bayesian framework. Considering the distinct degradation behaviors between testing units, we assume that degradation rates and change-points vary from unit to unit. Then hierarchical Bayesian approach is employed to estimate the parameters in the CPWP model. For comparison purpose, we also develop the maximum likelihood (ML) method. The results from simulation study show that the hierarchical Bayesian approach provides more robust inference on the model parameters than ML method. The analysis of OLED degradation data presents that the CPWP model outperforms three other existing models in terms of reliability prediction. (C) 2017 Elsevier Ltd. All rights reserved. | en_US |
dc.description.sponsorship | Wang's work was supported by China Scholarship Council (No.201506140046). Tang's work was supported by Natural Science Foundation of China (No.11271136 and 81530086) and the 111 Project (No.B14019). Bae's work was supported by Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Education (No. 2015R1D1A1A01059799). The authors would like to thank the Associate Editor and three anonymous reviewers for their constructive comments and valuable suggestions, which have helped in improving this paper significantly. | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | ELSEVIER SCI LTD | en_US |
dc.subject | Change-point | en_US |
dc.subject | Degradation test | en_US |
dc.subject | Hierarchical Bayesian | en_US |
dc.subject | Wiener process | en_US |
dc.title | Bayesian analysis of two-phase degradation data based on change-point Wiener process | en_US |
dc.type | Article | en_US |
dc.relation.volume | 170 | - |
dc.identifier.doi | 10.1016/j.ress.2017.09.027 | - |
dc.relation.page | 244-256 | - |
dc.relation.journal | RELIABILITY ENGINEERING & SYSTEM SAFETY | - |
dc.contributor.googleauthor | Wang, Pingping | - |
dc.contributor.googleauthor | Tang, Yincai | - |
dc.contributor.googleauthor | Bae, Suk Joo | - |
dc.contributor.googleauthor | He, Yong | - |
dc.relation.code | 2018002553 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DEPARTMENT OF INDUSTRIAL ENGINEERING | - |
dc.identifier.pid | sjbae | - |
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