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dc.contributor.author고광철-
dc.date.accessioned2019-12-05T14:52:55Z-
dc.date.available2019-12-05T14:52:55Z-
dc.date.issued2018-02-
dc.identifier.citationJOURNAL OF THE KOREAN PHYSICAL SOCIETY, v. 72, no. 4, page. 492-498en_US
dc.identifier.issn0374-4884-
dc.identifier.issn1976-8524-
dc.identifier.urihttps://link.springer.com/article/10.3938%2Fjkps.72.492-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/117581-
dc.description.abstractAs pulsed power systems and electromagnetic generators develop, the hazard of a high power electromagnetic (HPEM) pulse has gradually become more prominent. Generally, the propagated microwave has two main coupling paths. One is the front-door coupling path, which is a direct path through antennas to impact signals. The other is the back-door coupling path, which is an indirect path through untargeted parts, such as slots and cables. Because front-door coupling is coupled with the targeted parts, it can be vulnerable to an HPEM pulse. In this paper, we propose an integrated circuit model for an HPEM pulse, which considers each phenomenon of generation and propagation. The HPEM source model consists of a Marx generator and a virtual cathode oscillator, which are commonly used to make an HPEM pulse. The propagation model is composed of a series-parallel resistor, and the value of each resistor is determined by the propagation distance. The proposed model can be used to analyze the generation/propagation of HPEM pulses as one whole process, and it is easy to understand for various input waveform shapes.en_US
dc.description.sponsorshipThis work was supported by the Research Fund of the Survivability Technology Defense Research Center of the Agency for Defense Development of Korea (No. UD150013ID).en_US
dc.language.isoen_USen_US
dc.publisherKOREAN PHYSICAL SOCen_US
dc.subjectHigh power electromagnetic pulseen_US
dc.subjectIntegrated circuit modelen_US
dc.subjectCircuit analysisen_US
dc.titleIntegrated Circuit Model for Generation and Propagation of High Power Electromagnetic Pulseen_US
dc.typeArticleen_US
dc.relation.no4-
dc.relation.volume72-
dc.identifier.doi10.3938/jkps.72.492-
dc.relation.page492-498-
dc.relation.journalJournal of the Korean Physical Society-
dc.contributor.googleauthorCho, Young-Maan-
dc.contributor.googleauthorRhee, Jae-Ho-
dc.contributor.googleauthorBaek, Ji-Eun-
dc.contributor.googleauthorKo, Kwang-Cheol-
dc.relation.code2018034796-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING-
dc.identifier.pidkwang-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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