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dc.contributor.author박진성-
dc.date.accessioned2019-11-29T05:43:31Z-
dc.date.available2019-11-29T05:43:31Z-
dc.date.issued2017-08-
dc.identifier.citationIEEE TRANSACTIONS ON ELECTRON DEVICES, v. 64, no. 10, page. 4123-4130en_US
dc.identifier.issn0018-9383-
dc.identifier.issn1557-9646-
dc.identifier.urihttps://ieeexplore.ieee.org/document/8012542-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/115173-
dc.description.abstractPreviously reported thin-film transistor (TFT) digital logic gates are mostly static circuits. If the static logic circuits are implemented using either nMOS or pMOS technologies alone, unlike CMOS technologies, the circuits consume high power because of the steady-state current, and take large circuit area. In this paper, the dynamic logic circuits using n-type a-IGZO TFTs are proposed to resolve the power and circuit area issues. The dynamic logic circuits such as inverters and nand gates are fabricated in an amorphous indium-gallium-zinc-oxide TFT technology, and traditional static logic circuits are also implemented with the same technology for comparison purposes. The measurement results show that the proposed dynamic logic circuit consumes no steady-state current, and the circuit area is reduced by 93.1%.en_US
dc.description.sponsorshipThis work was supported in part by the Ministry of Trade, Industry and Energy under Grant 10052020 and in part by the Korea Display Research Corporation support program for the development of future devices technology for display industry. The review of this paper was arranged by Editor I. Kymissis. (Corresponding author: Byong-Deok Choi.)en_US
dc.language.isoen_USen_US
dc.publisherIEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INCen_US
dc.subjectAmorphous indium-gallium-zinc-oxide thin-film transistor (a-IGZO TFT)en_US
dc.subjectdynamic logicen_US
dc.subjectlogic circuiten_US
dc.subjectTFTsen_US
dc.titleDynamic Logic Circuits Using a-IGZO TFTsen_US
dc.typeArticleen_US
dc.relation.no10-
dc.relation.volume64-
dc.identifier.doi10.1109/TED.2017.2738665-
dc.relation.page4123-4130-
dc.relation.journalIEEE TRANSACTIONS ON ELECTRON DEVICES-
dc.contributor.googleauthorKim, Jong-Seok-
dc.contributor.googleauthorJang, Jun-Hwan-
dc.contributor.googleauthorKim, Yong-Duck-
dc.contributor.googleauthorByun, Jung-Woo-
dc.contributor.googleauthorHan, Kilim-
dc.contributor.googleauthorPark, Jin-Seong-
dc.contributor.googleauthorChoi, Byong-Deok-
dc.relation.code2017003133-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF MATERIALS SCIENCE AND ENGINEERING-
dc.identifier.pidjsparklime-
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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