Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 김학성 | - |
dc.date.accessioned | 2019-11-22T00:19:34Z | - |
dc.date.available | 2019-11-22T00:19:34Z | - |
dc.date.issued | 2017-03 | - |
dc.identifier.citation | MEASUREMENT SCIENCE AND TECHNOLOGY, v. 28, no. 2, Article no. 025001 | en_US |
dc.identifier.issn | 0957-0233 | - |
dc.identifier.issn | 1361-6501 | - |
dc.identifier.uri | https://iopscience.iop.org/article/10.1088/1361-6501/aa4ead | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/113346 | - |
dc.description.abstract | In this work, a terahertz time-domain spectroscopy (THz-TDS) imaging technique was used for non-contact measurement of the conductivity and coverage density (DC) of silver nanowires (SNWs) as transparent electrodes. The reflection mode of THz-TDS with an incident angle of 30 degrees was used, and the sheet resistance (R-sh) of SNW films was measured using the four-point probe method. The correlations between the THz reflection ratio and Rsh were studied by comparing the results of the four-point probe method and the measured THz reflection ratios. Also, the DC of SNWs was evaluated using THz waveforms with a general refractivity formula. This result matched well with a conventional approximation method using a scanning electron microscope image. Furthermore, defects in the SNWs could be easily detected using the THz-TDS imaging technique. The non-contact THz-TDS measurement method that we developed is expected to be a promising technique for non-contact measurement of the Rsh and DC for transparent conductive electrodes. | en_US |
dc.description.sponsorship | This research was also supported by a National Research Foundation of Korea (NRF) grant funded by the Korean Government (MEST) (2013M2A2A9043280). Also, this work was supported by the Industrial Strategic Technology Development Program (10052674, In-line Semiconductor Chip/ Package Inspection system with THz imaging) funded by the Ministry of Trade, Industry&Energy (MOTIE, Korea). Also, this work was supported by the research fund of Hanyang University (HY-2013). | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | IOP PUBLISHING LTD | en_US |
dc.subject | non-contact measurement | en_US |
dc.subject | sheet resistance | en_US |
dc.subject | coverage density | en_US |
dc.subject | transparent electrode | en_US |
dc.subject | silver nanowire | en_US |
dc.title | Non-contact measurement of the electrical conductivity and coverage density of silver nanowires for transparent electrodes using Terahertz spectroscopy | en_US |
dc.type | Article | en_US |
dc.relation.no | 2 | - |
dc.relation.volume | 28 | - |
dc.identifier.doi | 10.1088/1361-6501/aa4ead | - |
dc.relation.page | 1-8 | - |
dc.relation.journal | MEASUREMENT SCIENCE AND TECHNOLOGY | - |
dc.contributor.googleauthor | Park, Sung-Hyeon | - |
dc.contributor.googleauthor | Chung, Wan-Ho | - |
dc.contributor.googleauthor | Kim, Hak-Sung | - |
dc.relation.code | 2017002423 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DIVISION OF MECHANICAL ENGINEERING | - |
dc.identifier.pid | kima | - |
dc.identifier.orcid | http://orcid.org/0000-0002-6076-6636 | - |
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