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dc.contributor.author어영선-
dc.date.accessioned2019-05-14T05:05:11Z-
dc.date.available2019-05-14T05:05:11Z-
dc.date.issued2009-11-
dc.identifier.citation2009 International SoC Design Conference (ISOCC), Page. 436-439en_US
dc.identifier.isbn978-1-4244-5034-3-
dc.identifier.urihttps://ieeexplore.ieee.org/abstract/document/5423860-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/104172-
dc.description.abstractA new efficient and accurate eye diagram determination technique is presented. In order to estimate the worst case eye diagram, bit streams which may induce the worst ISI (inter symbol interference) are determined. Then the output responses for worst case bit streams are determined by using fast Fourier transform technique. The proposed technique is compared with SPICE simulation that employs PRBS (pseudorandom bit sequence) input signals.en_US
dc.description.sponsorshipThis work was supported by the Korea Science and Engineering Foundation (KOSEF) grant funded by the Korea government (MEST) (No. 2009-0075375).en_US
dc.language.isoen_USen_US
dc.publisherIEEEen_US
dc.subjectEye-diagramen_US
dc.subjectfrequency-variant characteristicsen_US
dc.subjectsignal integrityen_US
dc.subjectsignal transient responseen_US
dc.subjecttransmission lineen_US
dc.titleFast Eye Diagram Determination for the Signal Integrity Verification of Frequency-Variant transmission linesen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/SOCDC.2009.5423860-
dc.contributor.googleauthorKim, Hyunsik-
dc.contributor.googleauthorKim, Dongchul-
dc.contributor.googleauthorEo, Yungseon-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pideo-
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COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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