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dc.contributor.author신현철-
dc.date.accessioned2019-04-30T04:22:55Z-
dc.date.available2019-04-30T04:22:55Z-
dc.date.issued2016-12-
dc.identifier.citationINTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS, v. 45, No. 9, Page. 1231-1248en_US
dc.identifier.issn0098-9886-
dc.identifier.issn1097-007X-
dc.identifier.urihttps://onlinelibrary.wiley.com/doi/abs/10.1002/cta.2311-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/103047-
dc.description.abstractIn this paper, we present our decoupled differential read (DDR) port and bitline (BL) pre-charging scheme. The proposed scheme allows the charge sharing between bitlines during the read operation. DDR port isolates the internal nodes, thus improves the read static noise margin and allows the subthreshold operation. BLs are not pre-charged to full VDD. Read port is designed such that for the read ‘1’ operation, BL shares its charge with BLB, and for read ‘0’ operation, BL is charged toward VDD and BLB is discharged to the ground. The proposed non-VDD BL pre-charging and the charge-sharing mechanism provide substantial read power savings. Virtual power rail is used to suppress the BL leakages. A dynamic voltage level shifting preamplifier is used that shifts both BLs to the middle voltage and amplifies the voltage difference. Single-ended write driver is also presented that only conditionally charges the write BL. The proposed 10-transistor static random access memory cell using DDR provides more than 2 times read static noise margin, ~72% read power savings, and ~40% write power savings compared with the conventional six-transistor static random access memory. Copyright © 2016 John Wiley & Sons, Ltd.en_US
dc.description.sponsorshipTools are provided by IC Design Education Center Korea (idec.or.kr). The first and second authors are supported by Higher Education Commission Pakistan (hec.gov.pk). Partial funding for this work was provided by Samsung Electronics Inc. Korea.en_US
dc.language.isoen_USen_US
dc.publisherWILEY-BLACKWELLen_US
dc.subjectcharge sharingen_US
dc.subjectdifferential readen_US
dc.subjectlow poweren_US
dc.subjectSRAMen_US
dc.subjectsense amplifieren_US
dc.subjectleakage suppressionen_US
dc.subjectwrite driveren_US
dc.titleCharge-sharing read port with bitline pre-charging and sensing scheme for low-power SRAMsen_US
dc.typeArticleen_US
dc.identifier.doi10.1002/cta.2311-
dc.relation.page1-10-
dc.relation.journalINTERNATIONAL JOURNAL OF CIRCUIT THEORY AND APPLICATIONS-
dc.contributor.googleauthorMaroof, Naeem-
dc.contributor.googleauthorSohail, Muhammad-
dc.contributor.googleauthorShin, Hyunchul-
dc.relation.code2016002117-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDIVISION OF ELECTRICAL ENGINEERING-
dc.identifier.pidshin-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ELECTRICAL ENGINEERING(전자공학부) > Articles
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