Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성주 | - |
dc.date.accessioned | 2018-11-14T08:06:10Z | - |
dc.date.available | 2018-11-14T08:06:10Z | - |
dc.date.issued | 2008-06 | - |
dc.identifier.citation | 제9회 한국테스트학술대회, A-1 | en_US |
dc.identifier.uri | http://www.koreatest.or.kr/sub02/2008data/report/9th_koreatest.pdf | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/80410 | - |
dc.description.abstract | In this paper, we present efficient test patterns for the crosstalk–induced faults on System-on-a-Chip and board level interconnects considering actual effective aggressors to minimize the pattern size. All static faults also can be detected. The proposed method achieved the significant reduction of the number of test patterns than prior works, while preserving 100% fault coverage. We are in the process of extending the proposed technique to built-in-self test logics. | en_US |
dc.language.iso | ko_KR | en_US |
dc.publisher | 한국반도체테스트협회 | en_US |
dc.subject | Interconnect test | en_US |
dc.subject | crosstalk faults | en_US |
dc.subject | static faults | en_US |
dc.subject | test pattern | en_US |
dc.title | An Efficient Interconnect Test Patterns for Crosstalk and Static Faults | en_US |
dc.type | Article | en_US |
dc.contributor.googleauthor | Song, Jaehoon | - |
dc.contributor.googleauthor | Han, Juhee | - |
dc.contributor.googleauthor | Hwang, Doochan | - |
dc.contributor.googleauthor | Lee, Junseop | - |
dc.contributor.googleauthor | Park, Sungju | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF COMPUTING[E] | - |
dc.sector.department | DIVISION OF COMPUTER SCIENCE | - |
dc.identifier.pid | paksj | - |
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