Bluntness measurement of a Berkovich indenter
- Title
- Bluntness measurement of a Berkovich indenter
- Author
- 장재일
- Issue Date
- 2011-12
- Publisher
- World Scientific Publishing
- Citation
- INTERNATIONAL JOURNAL OF MODERN PHYSICS B, v. 25, NO 31, Page. 4273-4276
- Abstract
- Indenter blunting is inevitable in nanoindentations and results in unexpected contact properties. Both relaxation of the indentation size effects and deepening of the substrate effects under a blunted indenter cause a change of the bathtub-shaped hardness with indentation depth in a soft film on hard substrate. Thus an identification of three-dimensional morphology of an indenter apex is necessary for precise measurements of hardness in thin films. We observed an actual Berkovich indenter using an atomic force microscope (AFM). Through a quantitative analysis on the AFM image, data pairs of contact area versus contact depth were obtained; curvature radius of the apex was estimated by searching a sphere well-fitted to the indenter apex morphology. The estimated curvature radius and blunted height were 1043.9±50.9 nm and 44.4 nm, respectively. By comparing with the result from the modified Kick's law, both blunted heights were comparable each other within a 7 nm difference. This confirms validity of the direct observation method with the AFM.
- URI
- https://www.worldscientific.com/doi/abs/10.1142/S0217979211066751https://repository.hanyang.ac.kr/handle/20.500.11754/70532
- ISSN
- 0217-9792
- DOI
- https://doi.org/10.1142/S0217979211066751
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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