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dc.contributor.author박희진-
dc.date.accessioned2018-04-15T08:05:05Z-
dc.date.available2018-04-15T08:05:05Z-
dc.date.issued2011-06-
dc.identifier.citationIEICE TRANSACTIONS ON INFORMATION AND SYSTEMS E SERIES D, 2011, 94(6), P.1210-1215en_US
dc.identifier.issn0916-8532-
dc.identifier.urihttps://www.jstage.jst.go.jp/article/transinf/E94.D/6/E94.D_6_1210/_article-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/66683-
dc.description.abstractA safe prime p is a prime such that (p-1)/2 is also a prime. A primality test or a safe primality test is normally a combination of trial division and a probabilistic primality test. Since the number of small odd primes used in the trial division affects the performance of the combination, researchers have studied how to obtain the optimal number of small odd primes to be used in the trial division and the expected running time of the combination for primality tests. However, in the case of safe primality tests, the analysis of the combination is more difficult, and thus no such results have been given. In this paper, we present the first probabilistic analysis on the expected running time and the optimal number of small odd primes to be used in the trial division for optimizing the tests. Experimental results show that our probabilistic analysis estimates the behavior of the safe primality tests very well.en_US
dc.language.isoenen_US
dc.publisherInstitute of Electronics, Information and Communication Engineersen_US
dc.subjectsafe primeen_US
dc.subjectsafe prime generationen_US
dc.subjecttrial divisionen_US
dc.subjectmiller-rabin testen_US
dc.subjectcryptographyen_US
dc.subjectinformation securityen_US
dc.titleProbabilistic Analysis on the Optimal Combination of Trial Division and Probabilistic Primality Tests for Safe Prime Generationen_US
dc.typeArticleen_US
dc.relation.no6-
dc.relation.volumeE94-D-
dc.identifier.doi10.1587/transinf.E94.D.1210-
dc.relation.page1210-1215-
dc.relation.journalIEICE TRANSACTIONS ON INFORMATION AND SYSTEMS-
dc.contributor.googleauthorPark, H.-
dc.contributor.googleauthorKim, D.K.-
dc.relation.code2011203910-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDEPARTMENT OF COMPUTER SCIENCE-
dc.identifier.pidhjpark-
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COLLEGE OF ENGINEERING[S](공과대학) > COMPUTER SCIENCE(컴퓨터소프트웨어학부) > Articles
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