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"Double-layer" method to improve image quality of industrial SPECT

Title
"Double-layer" method to improve image quality of industrial SPECT
Author
김찬형
Keywords
Inspection with gamma rays; Detection of defects
Issue Date
2011-12
Publisher
IOP PUBLISHING LTD
Citation
JOURNAL OF INSTRUMENTATION, 2011, 6(12), P.12032~12032
Abstract
Recently a lab-scale single photon emission computed tomography (SPECT) system was constructed to study the details of the image formation process in an industrial SPECT system. The industrial SPECT system differs from a medical SPECT system in that it uses relatively large detectors and collimators in order to effectively detect high-energy gammas with enough collimation power, resulting always, however, in low-quality images. In this paper, a simple but very effective "double-layer" method is proposed as a means of improving the image quality of the industrial SPECT system. The rationale of the double-layer method is to simultaneously employ two layers of identical SPECT systems to increase the number of measurements points and, thereby, increase the image quality. The performance results of the double-layer method, as evaluated by Geant4 Monte Carlo simulations, showed dramatic improvement in image quality over those offered by the single-layer SPECT system. The improvement, additionally, was more marked for more complicated and higher-energy gamma sources.
URI
http://iopscience.iop.org/article/10.1088/1748-0221/6/12/C12032/metahttp://hdl.handle.net/20.500.11754/65896
ISSN
1748-0221
DOI
10.1088/1748-0221/6/12/C12032
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > NUCLEAR ENGINEERING(원자력공학과) > Articles
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