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challenging issues for terra-bit level perpendicular STT-MRAM

Title
challenging issues for terra-bit level perpendicular STT-MRAM
Author
홍진표
Keywords
Iron, Tunneling magnetoresistance, Electrodes, Tin, Thermal stability, Annealing
Issue Date
2014-12
Publisher
IEEE
Citation
Electron Devices Meeting (IEDM), 2014 IEEE International 2014 Dec, pp.19.2.1 - 19.2.4
Abstract
The current challenging issues for terra-bit-level perpendicular STT-MRAM cells have been reviewed in the view of four critical parameters such as TMR ratio, Δ, Jex, and α. The TMR ratio of p-MTJ spin-valves are reaching to <; 150% at the BEOL of >350°C. A single MgO based p- MTJ spin-valve could not satisfy Δ of > 74, proposing a double MgO based p-MTJ spin-valve. Jex in SyAF layer adequately met > 0.7erg/cm2 at BEOL of > 350°C. A Co2Fe6B2 based p-MTJ spin-valve limits to a of 0.005, necessary to develop a low α material such as full Heusler half-metal. Thus, an essential challenge in the future is to satisfy four critical parameters simultaneously at > 350°C and 300-mm TiN electrode wafers.
URI
http://ieeexplore.ieee.org.access.hanyang.ac.kr/document/7047081/http://hdl.handle.net/20.500.11754/58106
ISSN
2156-017X
DOI
10.1109/IEDM.2014.7047081
Appears in Collections:
COLLEGE OF NATURAL SCIENCES[S](자연과학대학) > PHYSICS(물리학과) > Articles
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