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dc.contributor.author신동수-
dc.date.accessioned2018-03-27T01:13:12Z-
dc.date.available2018-03-27T01:13:12Z-
dc.date.issued2013-04-
dc.identifier.citationJapanese Journal of Applied Physics, 2013, 52(5), P.058002en_US
dc.identifier.issn0021-4922-
dc.identifier.urihttp://iopscience.iop.org/article/10.7567/JJAP.52.058002/meta-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/52853-
dc.description.abstractIt is demonstrated with small-signal analysis how the voltage-dependent responsivity in the uni-travelling-carrier photodiode (UTC PD) can lead to the intermodulation distortion. A simple expression for the third-order output intercept point (OIP3) is derived and compared with experiments. Reasonable agreements between the theoretical and experimental OIP3 values are observed. (c) 2013 The Japan Society of Applied Physicsen_US
dc.language.isoenen_US
dc.publisherJapan SOC Applied Physicsen_US
dc.titleSmall-Signal Analysis of the Voltage-Dependent Nonlinearity in High-Power Uni-Traveling-Carrier Photodiodesen_US
dc.typeArticleen_US
dc.relation.no5-
dc.relation.volume52-
dc.identifier.doi10.7567/JJAP.52.058002-
dc.relation.page21-22-
dc.relation.journalJAPANESE JOURNAL OF APPLIED PHYSICS-
dc.contributor.googleauthorShin, Dong-Soo-
dc.relation.code2013010434-
dc.sector.campusS-
dc.sector.daehakGRADUATE SCHOOL[S]-
dc.sector.departmentDEPARTMENT OF BIONANOTECHNOLOGY-
dc.identifier.piddshin-
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GRADUATE SCHOOL[S](대학원) > ETC
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