Results 1-7 of 7 (Search time: 0.001 seconds).
|2007-10||Investigation of PZT damage during wafer-level bonding of thermo -piezoelectric cantilevers with CMOS wafers for probe-based data storage||이선영|
|2007-11||FTIR Analysis of PZT damage of wafer-level transfer of thermo-piezoelectric Si3N4 cantilevers on the CMOS-wafer for nano data storage applications||이선영|
|2007-06||Measurement of anisotropic compressive strength of rapid prototyping parts||이선영|
|2007-01||Silicon nitride cantilever array integraded with silicon heaters and piezoelectric detectors for probe-based data storage||이선영|
|2007-09||Thermal analysis of micro cantilevers integrated with heaters for low power nano-data-storage application||이선영|
|2007-09||Three dimensional analysis of thermal stress and prediction of failure of polytypoidally joined Si3N4-Al2O3 functionally graded material||이선영|
|2007-01||Thermo-piezoelectric Si3N4 cantilever array on CMOS circuit for high density probe-based data storage||이선영|