Full metadata record
DC Field | Value | Language |
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dc.contributor.author | 전형탁 | - |
dc.date.accessioned | 2018-03-23T06:02:51Z | - |
dc.date.available | 2018-03-23T06:02:51Z | - |
dc.date.issued | 2014-04 | - |
dc.identifier.citation | Current Applied Physics,Vol.14 No.4 [2014] ,552-557(6쪽) | en_US |
dc.identifier.issn | 1567-1739 | - |
dc.identifier.issn | 1878-1675 | - |
dc.identifier.uri | https://www.kci.go.kr/kciportal/ci/sereArticleSearch/ciSereArtiView.kci?sereArticleSearchBean.artiId=ART001875181 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/51347 | - |
dc.description.abstract | We report the permeation barrier properties of Al2O3/ZrO2 multi-layers deposited by remote plasma atomic layer deposition. Electrical Ca degradation tests were performed to derive the water vapor transmission rate (WVTR) of Al2O3, ZrO2 and Al2O3/ZrO2 multi-layers at 50 C and 50% relative humidity (RH). Al2O3/ZrO2 multi-layers exhibit better barrier properties than Al2O3 and ZrO2 layers, and when more individual layers were deposited in the same total thickness, the WVTR value was reduced further, indicating a better barrier property. The WVTR of the Al2O3 and ZrO2 layers were 9.5 103 and 1.6 102 g/m2 day, respectively, but when deposited alternatively with 1 cycle of each layer, the WVTR decreased to 9.9 104 g/m2 day. X-ray diffraction results indicated that ZrO2 has a monoclinic structure but Al2O3 and Al2O3/ZrO2 multi-layers show an amorphous structure. Cross sectional Al2O3/ZrO2 multilayer structures and the formation of a ZrAlxOy phase are observed by transmission electron microscopy (TEM). X-ray photoelectron spectrometry (XPS) results indicate that Al2O3 and ZrO2 contain 33.7% and 37.8%, respectively, AleOH and ZreOH bonding. However, the ZrAlxOy phase contained 30.5% AleOH and ZreOH bonding. The results of transmittance measurement indicate that overall, Al2O3, ZrO2 and Al2O3/ ZrO2 multi-layers show high transmittance greater than 80% in the visible region. We report the permeation barrier properties of Al"2O"3/ZrO"2 multi-layers deposited by remote plasma atomic layer deposition. Electrical Ca degradation tests were performed to derive the water vapor transmission rate (WVTR) of Al"2O"3, ZrO"2 and Al"2O"3/ZrO"2 multi-layers at 50 ^oC and 50% relative humidity (RH). Al"2O"3/ZrO"2 multi-layers exhibit better barrier properties than Al"2O"3 and ZrO"2 layers, and when more individual layers were deposited in the same total thickness, the WVTR value was reduced further, indicating a better barrier property. The WVTR of the Al"2O"3 and ZrO"2 layers were 9.5 x 10^-^3 and 1.6 x 10^-^2 g/m^2 day, respectively, but when deposited alternatively with 1 cycle of each layer, the WVTR decreased to 9.9 x 10^-^4 g/m^2 day. X-ray diffraction results indicated that ZrO"2 has a monoclinic structure but Al"2O"3 and Al"2O"3/ZrO"2 multi-layers show an amorphous structure. Cross sectional Al"2O"3/ZrO"2 multi-layer structures and the formation of a ZrAl"xO"y phase are observed by transmission electron microscopy (TEM). X-ray photoelectron spectrometry (XPS) results indicate that Al"2O"3 and ZrO"2 contain 33.7% and 37.8%, respectively, Al-OH and Zr-OH bonding. However, the ZrAl"xO"y phase contained 30.5% Al-OH and Zr-OH bonding. The results of transmittance measurement indicate that overall, Al"2O"3, ZrO"2 and Al"2O"3/ZrO"2 multi-layers show high transmittance greater than 80% in the visible region. | en_US |
dc.description.sponsorship | This work was supported by a National Research Foundation of Korea (NRF) grant funded by the Korean Government (MEST) (No. 2011-0015436). | en_US |
dc.language.iso | en | en_US |
dc.publisher | Elsevier | en_US |
dc.subject | Remote plasma atomic layer deposition | en_US |
dc.subject | Encapsulation | en_US |
dc.subject | Al2O3 | en_US |
dc.subject | ZrO2 | en_US |
dc.title | Permeation barrier properties of an Al2O3/ZrO2 multilayer deposited by remote plasma atomic layer deposition | en_US |
dc.title.alternative | ZrO2 multilayer deposited by remote plasma atomic layer deposition | en_US |
dc.type | Article | en_US |
dc.relation.volume | 14 | - |
dc.identifier.doi | 10.1016/j.cap.2013.11.053 | - |
dc.relation.page | 552-557 | - |
dc.relation.journal | CURRENT APPLIED PHYSICS | - |
dc.contributor.googleauthor | Lee, S | - |
dc.contributor.googleauthor | Choi, H | - |
dc.contributor.googleauthor | Shin, S | - |
dc.contributor.googleauthor | Park, J | - |
dc.contributor.googleauthor | Ham, G | - |
dc.contributor.googleauthor | Jung, H | - |
dc.contributor.googleauthor | Jeon, H | - |
dc.relation.code | 2014028061 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF ENGINEERING[S] | - |
dc.sector.department | DIVISION OF MATERIALS SCIENCE AND ENGINEERING | - |
dc.identifier.pid | hjeon | - |
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