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Product inspection policy for an imperfect production system with inspection errors and warranty cost

Title
Product inspection policy for an imperfect production system with inspection errors and warranty cost
Author
Biswajit Sarkar
Keywords
Production; Manufacturing system; Product inspection policy; Inspection errors; DETERIORATING PRODUCTION SYSTEM; PRODUCTION RUN-LENGTH; PREVENTIVE MAINTENANCE; EMQ MODEL; REPLENISHMENT POLICY; PRODUCTION-INVENTORY; ALLOWABLE SHORTAGES; PRODUCTION LOT; QUALITY; REWORK
Issue Date
2016-01
Publisher
ELSEVIER SCIENCE BV
Citation
EUROPEAN JOURNAL OF OPERATIONAL RESEARCH, v. 248, No. 1, Page. 263-271
Abstract
During manufacturing of products, all produced items are considered as perfect in general. This viewpoint of taking all finished products are perfect is not correct always. Defective items may occur during the production process for several reasons. This paper describes a deteriorating production process which randomly shifts to out-of-control state from in-control state. In case of full inspection policy, expected total cost together with inspection cost results higher inventory cost. Therefore, product inspection policy is better to use for reducing inspection costs. During product inspection process, inspectors may choose falsely a defective item as non-defective and vice-versa. Type I and Type II errors are incorporated in this model to make more realistic rather than existing models. This model includes a warranty policy for some fixed time periods. Some numerical examples, sensitivity analysis, and graphical representations are given to illustrate this model. (C) 2015 Elsevier B.V. and Association of European Operational Research Societies (EURO) within the International Federation of Operational Research Societies (IFORS). All rights reserved.
URI
https://www.sciencedirect.com/science/article/pii/S0377221715005354http://hdl.handle.net/20.500.11754/48674
ISSN
0377-2217; 1872-6860
DOI
10.1016/j.ejor.2015.06.021
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > ETC
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