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Highly stable solution-processed ZnO thin film transistors prepared via a simple Al evaporation process

Title
Highly stable solution-processed ZnO thin film transistors prepared via a simple Al evaporation process
Author
홍진표
Keywords
ZINC-OXIDE; TEMPERATURE FABRICATION; CHANNEL LAYER; DOPED ZNO; MOBILITY; DIFFUSION; GALLIUM
Issue Date
2014-02
Publisher
Royal SOC Chemistry
Citation
Journal of Materials Chemistry A, 2014, 2(8), P.1390-1395
Abstract
Amorphous metal oxide thin film transistors (TFTs) are expected to serve as building blocks in a variety of devices, such as bendable displays, transparent mobile phones, and plastic newspapers. Here, we report a simple approach for highly stable solution-based zinc oxide (ZnO) TFTs by simply evaporating Al on the back channel layer without any additional chemical or plasma process for passivation. In particular, control and manipulation of Al nanoparticle (NP) formation represents one of the key approaches in this work. The possible sketch of the improved nature is proposed, along with various structural and electrical analyses.
URI
http://pubs.rsc.org/en/Content/ArticleLanding/2014/TC/C3TC32341B#!divAbstracthttp://hdl.handle.net/20.500.11754/47438
ISSN
2050-7526; 2050-7534
DOI
10.1039/c3tc32341b
Appears in Collections:
COLLEGE OF NATURAL SCIENCES[S](자연과학대학) > PHYSICS(물리학과) > Articles
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