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Life and failure mechanism prediction of eco-friendly P2O5-SnO2-B2O3 glass frits

Title
Life and failure mechanism prediction of eco-friendly P2O5-SnO2-B2O3 glass frits
Author
최덕균
Keywords
glass frits; eco-friendly; Pb-free; accelerated life test; reliability; physics-of-failure; RELIABILITY
Issue Date
2013-10
Publisher
KOREAN INST METALS MATERIALS, KIM BLDG 6TH FLOOR, SEOCHO-DAERO 56 GIL 38, SEOCHO-GU, SEOUL 137-881, SOUTH KOREA
Citation
Electronic Materials Letters, 2013, 9(5), P.569-574
Abstract
Glass frits are used widely in the VFD, PDP, LCD, and OLED displays, solar cells, and automobiles. It is essential for glass frits to exhibit material properties such as low melting temperatures and coefficient of thermal expansion close to glass to prevent thermal shock and to lower the thermal stress. Glass frit containing 60%-85% of PbO lowers the melting temperature. However, PbO causes environmental pollution. In this study, we developed P2O5-SnO2-B2O3 glass frits and carried out life tests on these systems. In addition, life tests were also carried out on Pb-containing glass frits (VFD) for comparison to predict the life of the P2O5-SnO2-B2O3 systems. Subsequently, the failure mechanisms of VFD and Pb-free P2O5-SnO2-B2O3 glass frits were analyzed.
URI
http://link.springer.com/article/10.1007/s13391-012-2163-2http://hdl.handle.net/20.500.11754/44587
ISSN
1738-8090; 2093-6788
DOI
10.1007/s13391-012-2163-2
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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