Life and failure mechanism prediction of eco-friendly P2O5-SnO2-B2O3 glass frits
- Title
- Life and failure mechanism prediction of eco-friendly P2O5-SnO2-B2O3 glass frits
- Author
- 최덕균
- Keywords
- glass frits; eco-friendly; Pb-free; accelerated life test; reliability; physics-of-failure; RELIABILITY
- Issue Date
- 2013-10
- Publisher
- KOREAN INST METALS MATERIALS, KIM BLDG 6TH FLOOR, SEOCHO-DAERO 56 GIL 38, SEOCHO-GU, SEOUL 137-881, SOUTH KOREA
- Citation
- Electronic Materials Letters, 2013, 9(5), P.569-574
- Abstract
- Glass frits are used widely in the VFD, PDP, LCD, and OLED displays, solar cells, and automobiles. It is essential for glass frits to exhibit material properties such as low melting temperatures and coefficient of thermal expansion close to glass to prevent thermal shock and to lower the thermal stress. Glass frit containing 60%-85% of PbO lowers the melting temperature. However, PbO causes environmental pollution. In this study, we developed P2O5-SnO2-B2O3 glass frits and carried out life tests on these systems. In addition, life tests were also carried out on Pb-containing glass frits (VFD) for comparison to predict the life of the P2O5-SnO2-B2O3 systems. Subsequently, the failure mechanisms of VFD and Pb-free P2O5-SnO2-B2O3 glass frits were analyzed.
- URI
- http://link.springer.com/article/10.1007/s13391-012-2163-2http://hdl.handle.net/20.500.11754/44587
- ISSN
- 1738-8090; 2093-6788
- DOI
- 10.1007/s13391-012-2163-2
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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