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Atomic-Scale Simulations of Early Stage of Oxidation of Vicinal Si(001) Surfaces Using a Reactive Force-Field Potentials

Title
Atomic-Scale Simulations of Early Stage of Oxidation of Vicinal Si(001) Surfaces Using a Reactive Force-Field Potentials
Author
정용재
Keywords
INTERFACE STRUCTURE; MOLECULAR-DYNAMICS; THERMAL-OXIDATION; SI(100); STEP; SILICON; OXYGEN; MODEL
Issue Date
2011-10
Publisher
IOP PUBLISHING LTD, TEMPLE CIRCUS, TEMPLE WAY, BRISTOL BS1 6BE, ENGLAND
Citation
Japanese Journal of Applied Physics, 50(10),10PF01
Abstract
The early stages of the oxidation process on vicinal Si(001) surfaces were studied at the atomic scale using reactive-force field-based molecular dynamics simulations. Oxygen molecules at step edges on the vicinal Si(001) surface showed higher reactivity than those on flat terraces. In macroscopic simulations of oxidation on vicinal Si(001) surfaces with different miscut angles (0 degrees, 5.5 degrees, 10.5 degrees), we found that the initiation of oxidation with higher miscut angles was earlier than with lower angles. These results clearly show that a high density of step edges on the vicinal Si surface accelerates the initial oxidation. (C) 2011 The Japan Society of Applied Physics
URI
http://iopscience.iop.org/article/10.1143/JJAP.50.10PF01/meta
ISSN
0021-4922; 1347-4065
DOI
10.1143/JJAP.50.10PF01
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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