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dc.contributor.author오제훈-
dc.date.accessioned2018-02-08T07:33:34Z-
dc.date.available2018-02-08T07:33:34Z-
dc.date.issued2015-05-
dc.identifier.citationJOURNAL OF MICROMECHANICS AND MICROENGINEERING, v. 25, No. 5en_US
dc.identifier.issn0960-1317-
dc.identifier.issn1361-6439-
dc.identifier.urihttp://iopscience.iop.org/article/10.1088/0960-1317/25/5/055011/meta-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/36301-
dc.description.abstractWe demonstrate the effects of overlap condition and surface wettability of dielectric layers on the drying process and crystalline structure of inkjet-printed semiconductor layers. 6,13-bis(triisopropylsilylethynyl) pentacene (TIPS pentacene) was utilized to inkjet-print the semiconductor layer. Using various overlap conditions, semiconductor layers were inkjet-printed on dielectric layers with different surface wettabilities. It is observed that crystal growth and the resulting crystalline structures in inkjet-printed semiconductor layers are primarily determined by evaporation behavior, particularly the contact line movement of the drying semiconductor layers, which can be controlled via the overlap condition. With inappropriate overlap conditions, randomly oriented TIPS pentacene crystalline structures are generated in the semiconductor layer through irregular contact line recession. One-dimensionally oriented TIPS pentacene crystal structures can be obtained using the optimized overlap condition of 50% as a result of the uniform contact line movement. Relatively hydrophobic dielectric layers help to generate good crystallinity in the semiconductor layer. All-inkjet-printed organic thin film transistors (OTFTs) with well-oriented TIPS pentacene crystalline structures in the semiconductor layer show a high field effect mobility of similar to 0.1 cm(2) V(-1)s(-1), suggesting that, when printing inkjet semiconductor layers, the overlap condition and surface wettability of the dielectric layer are important factors for generating a well-oriented crystalline structure and thereby fabricating high-performance all-inkjet-printed OTFTs.en_US
dc.description.sponsorshipThis work was supported by Basic Science Research Program through the National Research Foundation of Korea (NRF) funded by the Ministry of Education (2013R1A1A2011800).en_US
dc.language.isoen_USen_US
dc.publisherIOP PUBLISHING LTDen_US
dc.subjectprinted electronicsen_US
dc.subjectinkjet printingen_US
dc.subjectall-inkjet-printed organic thin film transistoren_US
dc.subjectTIPS pentaceneen_US
dc.subjectsemiconductor layeren_US
dc.subjectcrystalline structureen_US
dc.subjectTHIN-FILM TRANSISTORSen_US
dc.subjectSELF-ORGANIZATIONen_US
dc.subjectSINGLE-CRYSTALen_US
dc.subjectORGANIC SEMICONDUCTORSen_US
dc.subjectPENTACENEen_US
dc.subjectPERFORMANCEen_US
dc.subjectSUBSTRATEen_US
dc.subjectCIRCUITSen_US
dc.subjectGROWTHen_US
dc.subjectFLOWen_US
dc.titleControl of the crystalline structure of inkjet-printed semiconductor layers using overlap condition and surface wettabilityen_US
dc.typeArticleen_US
dc.relation.no5-
dc.relation.volume25-
dc.identifier.doi10.1088/0960-1317/25/5/055011-
dc.relation.page1-8-
dc.relation.journalJOURNAL OF MICROMECHANICS AND MICROENGINEERING-
dc.contributor.googleauthorKang, BJ-
dc.contributor.googleauthorOh, JH-
dc.relation.code2015000640-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF ENGINEERING SCIENCES[E]-
dc.sector.departmentDEPARTMENT OF MECHANICAL ENGINEERING-
dc.identifier.pidjehoon-
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MECHANICAL ENGINEERING(기계공학과) > Articles
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