Results 1-4 of 4 (Search time: 0.001 seconds).
Issue Date | Title | Author(s) |
---|---|---|
2008-05 | Low Cost Scan Test for IEEE 1500-Based SoC | 박성주 |
2008-02 | IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트 | 박성주 |
2008-06 | Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains | 박성주 |
2008-05 | Low-cost scan test for IEEE-1500-Based SoC | 박성주 |