| 2019-05 | Current- and temperature-dependent efficiency droops in InGaN-based blue and AlGaInP-based red light-emitting diodes | 신동수 |
| 2019-05 | Polarization errors associated with reflective objectives in a micro-spot spectroscopic ellipsometer | 안일신 |
| 2019-05 | Blue Emission of alpha-GaN Colloidal Quantum Dots via Zn Doping | 김재균 |
| 2019-04 | Soliton fractional charge of disordered graphene nanoribbon | 차민철 |
| 2019-02 | Evidence for moire excitons in van der Waals heterostructures | 김수은 |
| 2005-12 | Generic superfluid-insulator transition in the spherical limit in two dimensions | 차민철 |
| 2005-12 | Rigorous coupled-wave analysis를 이용한 극자외선 리소그래피에서 그림자 효과를 줄이기 위한 마스크 변형 | 신동수 |
| 2005-12 | 전기광학 폴리머 도파관에 바탕한 애들이발 광변조기 | 신동수 |
| 2005-12 | Quasiparticle gap in a disordered boson Hubbard model in two dimensions | 차민철 |
| 2005-11 | Superfluid-insulator transitions of two-species bosons in an optical lattice | 차민철 |
| 2005-10 | Rubbed Polyimide Layers Studied by Rotating Sample and Compensator Spectroscopic Ellipsometry | 안일신 |
| 2005-10 | A Measurement method of the resonantly enhanced gain spectrum and its effect on second harmonic generation in Vertical-External-Cavity Surface-Emitting Laser(VECSEL) | 심종인 |
| 2005-09 | Critical aspect of curing epoxy adhesive: fiber pistoning of LC connector | 신동수 |
| 2005-08 | Effect of a step barrier on the quantum-confined Stark effect and applications to electroabsorption modulators with high saturation optical power | 신동수 |
| 2005-08 | Line-Width Variation with Absorber Thickness in Extreme Ultraviolet Lithography | 안일신 |
| 2005-07 | Lens Aberration Effect on the Line Width for Different Pattern Shapes and Duty Ratios | 안일신 |
| 2005-06 | Determination of the Optical Functions of Various Liquids by Rotating Compensator Multichannel Spectroscopic Ellipsometry | 안일신 |
| 2005-06 | Bulk Effects of Thermal Flow Resists | 안일신 |
| 2005-06 | Spectroscopic Ellipsometry Studies of Thin Films Prepared by Glancing Angle Deposition | 안일신 |
| 2005-06 | Calibration-Free Multichannel Ellipsometry for Retardance Measurement | 안일신 |
