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COLLEGE OF COMPUTING[E](소프트웨어융합대학)
COMPUTER SCIENCE(소프트웨어학부)
MEDIA, CULTURE, AND DESIGN TECHNOLOGY(ICT융합학부)
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Results 11-11 of 11 (Search time: 0.002 seconds).
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2008-05
Low-cost scan test for IEEE-1500-Based SoC
박성주
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IEEE 1149.1
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AMBA
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SoC
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at-speed test
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delay test
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Design for test
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design-for-testability (DtT)
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parallel test
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reduced pin-count test (RPCT)
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Scan Test
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2014
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2011
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2008
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2007
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