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COLLEGE OF COMPUTING[E](소프트웨어융합대학)
COMPUTER SCIENCE(소프트웨어학부)
MEDIA, CULTURE, AND DESIGN TECHNOLOGY(ICT융합학부)
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Results 1-9 of 9 (Search time: 0.001 seconds).
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Title
Author(s)
2007-11
천이 지연 고장 테스트를 위한 개선된 IEEE 1500 래퍼 셀 및 인터페이스 회로 설계
박성주
2007-11
저비용 SoC 테스트를 위한 IEEE 1500 래퍼 및 테스트 제어
박성주
2007-05
저비용 SoC 테스트를 위한 IEEE 1500 래퍼 설계
박성주
2008-05
Low Cost Scan Test for IEEE 1500-Based SoC
박성주
2007-02
칩 및 코아간 연결선의 지연 고장 테스트
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2008-02
IEEE 1500 래퍼를 이용한 효과적인 AMBA 기반 시스템-온-칩 코아 테스트
박성주
2008-06
Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains
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2007-05
AMBA 기반 임베디드 코아 테스트를 위한 IEEE 1500레퍼 설계
박성주
2008-05
Low-cost scan test for IEEE-1500-Based SoC
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IEEE 1149.1
2
AMBA
2
at-speed test
2
delay test
2
Design for test
2
design-for-testability (DtT)
2
reduced pin-count test (RPCT)
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Scan Test
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SoC
2
system-on-a-chip (SoC)
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-Date issued
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2008
5
2007
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