Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 안일신 | - |
dc.date.accessioned | 2018-02-08T02:02:52Z | - |
dc.date.available | 2018-02-08T02:02:52Z | - |
dc.date.issued | 2015-05 | - |
dc.identifier.citation | FORENSIC SCIENCE INTERNATIONAL, v. 253, Page. 28-32 | en_US |
dc.identifier.issn | 0379-0738 | - |
dc.identifier.issn | 1872-6283 | - |
dc.identifier.uri | https://www.sciencedirect.com/science/article/pii/S0379073815002029 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/36106 | - |
dc.description.abstract | Imaging ellipsometry (IE) is applied to visualize latent fingermarks on specular surfaces. Instead of a real image, IE provides images related to the polarization states, which are changed by the imprinted layer on a surface. Fingermarks formed on the surfaces of various materials are investigated, including a shiny metal and a black-colored plastic. Relatively clear IE images are obtained from most surfaces on which the optical properties are distinguishable from those of the fingermarks. Also, it is shown that discernible IE images can be obtained even after a fingermark is vigorously rubbed with lab tissues. (C) 2015 Elsevier Ireland Ltd. All rights reserved. | en_US |
dc.description.sponsorship | This work was supported by the Future Semiconductor Device Technology Development Program (10049185) funded by the MOTIE (Ministry of Trade, Industry & Energy) and KSRC (Korea Semiconductor Research Consortium). | en_US |
dc.language.iso | en_US | en_US |
dc.publisher | ELSEVIER IRELAND LTD | en_US |
dc.subject | Fingermark | en_US |
dc.subject | Imaging | en_US |
dc.subject | Ellipsometry | en_US |
dc.subject | Non-destructive | en_US |
dc.subject | Polarization | en_US |
dc.subject | FINGERPRINT DETECTION | en_US |
dc.subject | SPECTROSCOPY | en_US |
dc.subject | TIME | en_US |
dc.title | Application of imaging ellipsometry to the detection of latent fingermarks | en_US |
dc.type | Article | en_US |
dc.relation.volume | 253 | - |
dc.identifier.doi | 10.1016/j.forsciint.2015.05.009 | - |
dc.relation.page | 28-32 | - |
dc.relation.journal | FORENSIC SCIENCE INTERNATIONAL | - |
dc.contributor.googleauthor | An, Ilsin | - |
dc.relation.code | 2015003543 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF SCIENCE AND CONVERGENCE TECHNOLOGY[E] | - |
dc.sector.department | DEPARTMENT OF PHOTONICS AND NANOELECTRONICS | - |
dc.identifier.pid | ilsin | - |
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