Effects of surface morphology on retention loss of ferroelectric domains in poly(vinylidenefluoride-co-trifluoroethylene) thin films
- Title
- Effects of surface morphology on retention loss of ferroelectric domains in poly(vinylidenefluoride-co-trifluoroethylene) thin films
- Author
- 성태현
- Keywords
- FERROELECTRIC crystals; FERROELECTRIC devices; SOLID state electronics; PIEZOELECTRIC devices; THIN films
- Issue Date
- 2011-08
- Publisher
- AMER INST PHYSICS, CIRCULATION & FULFILLMENT DIV, 2 HUNTINGTON QUADRANGLE, STE 1 N O 1, MELVILLE, NY 11747-4501 USA
- Citation
- Applied Physics Letters. 8/29/2011, Vol. 99 Issue 9, p092905. 3p. 1 Color Photograph, 1 Diagram, 1 Graph.
- Abstract
- Effects of surface morphology on the retention loss of ferroelectric domains of poly(vinylidenefluoride-co-trifluoroethylene) thin films were investigated using piezoresponse force microscopy. We found that the retention loss occurred by nucleation of opposite domains at the regions with morphological gradients between 0.079 and 0.146. In addition, we observed collective decreases in piezoresponse amplitude of the opposite domains after 0.8 x 10(6) s, although each reversed domain showed different growth rate as evidenced by different threshold time for phase reversal. These results suggest that the surface morphology has a strong influence in determining the nucleation and growth kinetics by which the retention loss occurs. (C) 2011 American Institute of Physics.
- URI
- http://aip.scitation.org/doi/10.1063/1.3632042http://hdl.handle.net/20.500.11754/36094
- ISSN
- 0003-6951
- DOI
- 10.1063/1.3632042
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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