Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박진구 | - |
dc.date.accessioned | 2017-08-03T07:13:18Z | - |
dc.date.available | 2017-08-03T07:13:18Z | - |
dc.date.issued | 2015-10 | - |
dc.identifier.citation | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS, v. 14, NO 4, Page. 43501-43501 | en_US |
dc.identifier.issn | 1932-5150 | - |
dc.identifier.issn | 1932-5134 | - |
dc.identifier.uri | http://nanolithography.spiedigitallibrary.org/article.aspx?articleid=2457407 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/28259 | - |
dc.description.abstract | We report on out-of-band (OoB) radiation that can cause degradation to the image quality in extreme-ultraviolet (EUV) lithography systems. We investigated the effect of OoB radiation with an EUV pellicle and found the maximum allowable reflectivity of OoB radiation from the EUV pellicle that can satisfy certain criteria (i.e., the image critical dimension error, contrast, and normalized image log slope). We suggested a multistack EUV pellicle that can obtain a high EUV transmission, minimal reflectivity of OoB radiation, and sufficient deep ultraviolet transmission for defect inspection and alignment without removing the EUV pellicle in an EUV lithography system. (C) 2015 Society of Photo-Optical Instrumentation Engineers (SPIE) | en_US |
dc.description.sponsorship | This work was supported partly by the Future Semiconductor Device Technology Development Program #10045366 funded by Ministry of Trade, Industry, and Energy and Korea Semiconductor Research Consortium. | en_US |
dc.language.iso | en | en_US |
dc.publisher | SPIE-SOC PHOTO-OPTICAL INSTRUMENTATION ENGINEERS | en_US |
dc.subject | extreme-ultraviolet lithography | en_US |
dc.subject | defect-free mask | en_US |
dc.subject | contaminations | en_US |
dc.subject | extreme-ultraviolet pellicle | en_US |
dc.subject | multistack structure | en_US |
dc.subject | out-of-band radiation | en_US |
dc.title | Multistack structure for an extreme-ultraviolet pellicle with out-of-band radiation reduction | en_US |
dc.type | Article | en_US |
dc.relation.no | 4 | - |
dc.relation.volume | 14 | - |
dc.identifier.doi | 10.1117/1.JMM.14.4.043501 | - |
dc.relation.page | 43501-43501 | - |
dc.relation.journal | JOURNAL OF MICRO-NANOLITHOGRAPHY MEMS AND MOEMS | - |
dc.contributor.googleauthor | Lee, Sung-Gyu | - |
dc.contributor.googleauthor | Kim, Guk-Jin | - |
dc.contributor.googleauthor | Kim, In-Seon | - |
dc.contributor.googleauthor | Ahn, Jin-Ho | - |
dc.contributor.googleauthor | Park, Jin-Goo | - |
dc.contributor.googleauthor | Oh, Hye-Keun | - |
dc.relation.code | 2015009155 | - |
dc.sector.campus | S | - |
dc.sector.daehak | GRADUATE SCHOOL[S] | - |
dc.sector.department | DEPARTMENT OF BIONANOTECHNOLOGY | - |
dc.identifier.pid | jgpark | - |
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