300 0

Full metadata record

DC FieldValueLanguage
dc.contributor.author신동수-
dc.date.accessioned2017-07-27T01:12:04Z-
dc.date.available2017-07-27T01:12:04Z-
dc.date.issued2015-10-
dc.identifier.citation20th Microoptics Conference (MOC’15), Fukuoka, Japan, Oct. 25 - 28, 2015, Page. 70-71en_US
dc.identifier.isbn978-4-8634-8486-3-
dc.identifier.urihttp://ieeexplore.ieee.org/document/7416402/-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/28060-
dc.description.abstractTo understand how each experimental parameter influences optoelectronic performances of InGaN-based LEDs, a method of systematic analysis that assesses the interrelations independently and quantitatively is absolutely necessary. Here, we introduce various characterization techniques to clarify the performance of LEDs and hidden severity of the detrimental effects, starting from the simple I-V measurement to more sophisticated temperature-dependent, spectroscopic, and LED efficiency measurements.en_US
dc.language.isoenen_US
dc.publisherThe Japan Society of Applied Physicsen_US
dc.subjectLight emitting diodesen_US
dc.subjectTemperature measurementen_US
dc.subjectPhotoconductivityen_US
dc.subjectQuantum well devicesen_US
dc.subjectCapacitance-voltage characteristicsen_US
dc.subjectPower generationen_US
dc.subjectVoltage measurementen_US
dc.titleTechniques for optoelectronic performance evaluation in InGaN-based light-emitting diodesen_US
dc.typeArticleen_US
dc.identifier.doi10.1109/MOC.2015.7416402-
dc.relation.page70-71-
dc.contributor.googleauthorShim, Jong-In-
dc.contributor.googleauthorShin, Dong-Soo-
dc.sector.campusS-
dc.sector.daehakGRADUATE SCHOOL[S]-
dc.sector.departmentDEPARTMENT OF BIONANOTECHNOLOGY-
dc.identifier.piddshin-
Appears in Collections:
GRADUATE SCHOOL[S](대학원) > BIONANOTECHNOLOGY(바이오나노학과) > Articles
Files in This Item:
There are no files associated with this item.
Export
RIS (EndNote)
XLS (Excel)
XML


qrcode

Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.

BROWSE