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Coplanar homojunction a-InGaZnO thin film transistor fabricated using ultraviolet irradiation

Title
Coplanar homojunction a-InGaZnO thin film transistor fabricated using ultraviolet irradiation
Author
최덕균
Keywords
OXIDE SEMICONDUCTOR; DEPOSITION
Issue Date
2015-09
Publisher
ROYAL SOC CHEMISTRY
Citation
RSC ADVANCES, v. 5, NO 101, Page. 82947-82951
Abstract
We have developed a new technique to fabricate coplanar homojunction structure a-IGZO thin film transistors (TFTs) by adopting selective ultraviolet (UV) irradiation in the n(+) source/drain regions of an a-IGZO layer through a patterned photoresist mask. In order to apply this technique for coplanar homojunction a-IGZO TFTs, we systematically studied the effect of dual wavelength (185 nm and 254 nm) UV irradiation time on the conductivity of a-IGZO films. Various materials were evaluated to find one that provided proper shielding against UV irradiation. The resistivity of the a-IGZO film drastically decreased from an as-deposited value of 2.71 x 10(6) Omega cm to 3.76 x 10(-5) Omega cm after UV irradiation. The lowest resistivity obtained in this study is similar to that of ITO transparent electrodes and is about 2 orders of magnitude lower than the values obtained to date. Coplanar homojunction a-IGZO TFTs were successfully fabricated by introducing an optimized process that included UV irradiation through a patterned photoresist UV mask. The saturation mobility (mu(sat)), threshold voltage (V-th), sub-threshold swing (SS), and on/off current ratio (I-on/I-off) were measured to be 6.7 cm(2) V-1 s, 7.3 V, 0.21 V per decade, and similar to 10(9), respectively. Moreover, we showed that the UV irradiation technique provided both a low contact resistance due to the high conductivity in the source/drain region and a small channel length modulation due to non-thermal doping behavior. We believe that this UV irradiation process is a useful technique because it is simple and results in outstanding electrical properties.
URI
http://pubs.rsc.org/en/Content/ArticleLanding/2015/RA/C5RA16443E#!divAbstracthttp://hdl.handle.net/20.500.11754/27397
ISSN
2046-2069
DOI
10.1039/c5ra16443e
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > MATERIALS SCIENCE AND ENGINEERING(신소재공학부) > Articles
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