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dc.contributor.author정규선-
dc.date.accessioned2017-03-31T05:20:46Z-
dc.date.available2017-03-31T05:20:46Z-
dc.date.issued2015-07-
dc.identifier.citationFUSION SCIENCE AND TECHNOLOGY, v. 68, NO 1, Page. 157-160en_US
dc.identifier.issn1536-1055-
dc.identifier.issn1943-7641-
dc.identifier.urihttp://www.ans.org/pubs/journals/fst/a_37140-
dc.identifier.urihttp://hdl.handle.net/20.500.11754/26488-
dc.description.abstractWe investigated charged dust and its effect on RF plasma by using a planar electric probe in a large-scale device. In background plasmas, the particle density is 10(8) to 10(9) cm(-3) and the electron temperature is 2 to 4 eV. When dust is contained in plasma, it is negatively charged by electrons attached to the dust. The charged dust density and the charge were calculated by comparing dusty helium plasma to pure helium plasma. Depending on the increase in the amount of dust, the charged dust density increases with the decrease in the charge due to depletion of the electrons in the background plasma. The results show that the charge changes the interactions between the dust and particles in the background plasma.en_US
dc.description.sponsorshipThis research was supported by the National R&D program through the National Research Foundation of Korea (NRF) funded by the Ministry of Science, ICT & Future Planning (2015M1A7A1A01002784) and was partially supported by the R&D Program through the National Fusion Research Institute of Korea (NFRI) under the Korea Research Council of Fundamental Science and Technology.en_US
dc.language.isoenen_US
dc.publisherAMER NUCLEAR SOCen_US
dc.subjectdusty plasmaen_US
dc.subjectnegatively charged dusten_US
dc.subjectcharged potentialen_US
dc.titleMEASUREMENT OF NEGATIVELY CHARGED DUST BY USING AN ELECTRIC PROBE IN LARGE RF HELIUM PLASMASen_US
dc.typeArticleen_US
dc.relation.no1-
dc.relation.volume68-
dc.identifier.doi10.13182/FST14-876-
dc.relation.page157-160-
dc.relation.journalFUSION SCIENCE AND TECHNOLOGY-
dc.contributor.googleauthorCho, S. G.-
dc.contributor.googleauthorLho, T.-
dc.contributor.googleauthorChoi, H.G.-
dc.contributor.googleauthorBae, M.-K.-
dc.contributor.googleauthorKang, I.J.-
dc.contributor.googleauthorLee, D.H.-
dc.contributor.googleauthorJoo, S.K.-
dc.contributor.googleauthorChung, K.-S.-
dc.relation.code2015001122-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF ENGINEERING[S]-
dc.sector.departmentDIVISION OF ELECTRICAL AND BIOMEDICAL ENGINEERING-
dc.identifier.pidkschung-
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COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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