Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 문순재 | - |
dc.date.accessioned | 2016-10-28T01:36:59Z | - |
dc.date.available | 2016-10-28T01:36:59Z | - |
dc.date.issued | 2015-04 | - |
dc.identifier.citation | JOURNAL OF APPLIED PHYSICS, v. 117, NO 13, Page. 1-6 | en_US |
dc.identifier.issn | 0021-8979 | - |
dc.identifier.issn | 1089-7550 | - |
dc.identifier.uri | http://scitation.aip.org/content/aip/journal/jap/117/13/10.1063/1.4916722 | - |
dc.identifier.uri | http://hdl.handle.net/20.500.11754/23969 | - |
dc.description.abstract | The temperature dependence of the electronic response of BiFeO3 thin film grown on a SrTiO3 substrate is investigated using spectroscopic ellipsometry. By analyzing the pseudodielectric function, we identify two d-d crystal field transitions of Fe3+ ions in the energy region between 1 and 2 eV. The d-d transitions show abnormal temperature dependence that cannot be attributed to conventional electron-phonon interactions. The origin of the abnormal temperature dependence is discussed in terms of spin-charge coupling. The temperature dependence of the charge transfer transitions located above 2.5 eV is characterized by standard critical point model analysis of the 2nd derivatives of the dielectric function. This analysis provides detailed information of the critical point parameters for charge transfer transitions. (C) 2015 AIP Publishing LLC. | en_US |
dc.description.sponsorship | This work was supported by the Institute for Basic Science (IBS) in Korea (IBS-R009-D1) and by the Basic Science Research Program through the National Research Foundation of Korea funded by the Ministry of Science, ICT & Future Planning (2012R1A1A1013274). | en_US |
dc.language.iso | en | en_US |
dc.publisher | AMER INST PHYSICS | en_US |
dc.subject | OPTICAL-PROPERTIES | en_US |
dc.subject | PARAMETERS | en_US |
dc.subject | GAAS | en_US |
dc.subject | GAP | en_US |
dc.title | Temperature dependence of the electronic transitions in BiFeO3 thin film studied by spectroscopic ellipsometry | en_US |
dc.type | Article | en_US |
dc.relation.no | 13 | - |
dc.relation.volume | 117 | - |
dc.identifier.doi | 10.1063/1.4916722 | - |
dc.relation.page | 1-6 | - |
dc.relation.journal | JOURNAL OF APPLIED PHYSICS | - |
dc.contributor.googleauthor | Kang, T. D. | - |
dc.contributor.googleauthor | Jeon, B. C. | - |
dc.contributor.googleauthor | Moon, S. J. | - |
dc.relation.code | 2015003356 | - |
dc.sector.campus | S | - |
dc.sector.daehak | COLLEGE OF NATURAL SCIENCES[S] | - |
dc.sector.department | DEPARTMENT OF PHYSICS | - |
dc.identifier.pid | soonjmoon | - |
Items in DSpace are protected by copyright, with all rights reserved, unless otherwise indicated.