A High-Speed Wafer-Scale CMOS X-Ray Detector With Column-Parallel ADCs Using Oversampling Binning Method
- Title
- A High-Speed Wafer-Scale CMOS X-Ray Detector With Column-Parallel ADCs Using Oversampling Binning Method
- Author
- 권오경
- Keywords
- CMOS X-ray detector; column-parallel extended-counting analog-to-digital converter (EC ADC); oversampling binning operation; pipelined timing; wafer-scale sensor
- Issue Date
- 2015-03
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE TRANSACTIONS ON ELECTRON DEVICES, v. 62, NO 3, Page. 888-895
- Abstract
- This paper presents a high-speed wafer-scale CMOS X-ray detector with an active area of 12 cm x 12 cm, which features 100 mu m-sized pixels. A horizontal row driver is adopted for implementing a three-side buttable detector with the tiling technique and thereby enabling the extension of the active area. The proposed detector employs 14-b column-parallel extended-counting analog-to-digital converters (EC ADCs) using digital correlated double sampling for high-speed operation and high-gray-scale resolution. The oversampling binning method using a Delta Sigma modulator in EC ADCs is proposed for high sensitivity and the pipelined timing method is adopted for a high frame rate, which results in reduction of the X-ray dose. An offset cancellation method for the input buffer is used to improve the uniformity between column ADCs. The proposed CMOS X-ray detector is fabricated using a 0.35-mu m CMOS process with the stitching technique. The measured differential column fixed pattern noise and random noise without X-ray exposure are 3.01 and 3.06 least significant bits, respectively, at a resolution of 14 b. In the full-resolution mode, the proposed detector operates up to a frame frequency of 108 frames/s with the pipelined timing and 60 frames/s without the pipelined timing.
- URI
- http://ieeexplore.ieee.org/document/7006786/?arnumber=7006786http://hdl.handle.net/20.500.11754/22980
- ISSN
- 0018-9383; 1557-9646
- DOI
- 10.1109/TED.2014.2386533
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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