Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성주 | - |
dc.date.accessioned | 2023-08-22T01:47:04Z | - |
dc.date.available | 2023-08-22T01:47:04Z | - |
dc.date.issued | 2007-05 | - |
dc.identifier.citation | Proceedings of the IEEE VLSI Test Symposium, article no. 4209941, Page. 375-380 | - |
dc.identifier.issn | 1093-0167;2375-1053 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/4209941 | en_US |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/185668 | - |
dc.description.abstract | A Test Interface Controller (TIC) provided by ARM Ltd. is widely used for functional testing of System-on-a-Chip (SoC) which adopts an Advanced Microcontroller Bus Architecture (AMBA) bus system. Unfortunately, this architecture has the deficiency of not being able to concurrently shift in and out the structural scan test patterns through the TIC and AMBA bus. This paper introduces a new AMBA based Test Access Mechanism (ATAM) for speedy testing of SoCs embedding ARM cores. Since scan-in and out operations can be performed simultaneously, test application time on the expensive Automatic Test Equipment (ATE) can be drastically reduced while preserving the compatibility with the ARM TIC. © 2007 IEEE. | - |
dc.description.sponsorship | This work is partly supported by the System IC 2010 project of Consortium of Semiconductor Advanced Research (COSAR) in Korea. | - |
dc.language | en | - |
dc.publisher | IEEE | - |
dc.title | Design of test access mechanism for AMBA-based system-on-a-chip | - |
dc.type | Article | - |
dc.identifier.doi | 10.1109/VTS.2007.25 | - |
dc.relation.page | 375-380 | - |
dc.relation.journal | Proceedings of the IEEE VLSI Test Symposium | - |
dc.contributor.googleauthor | Song, Jaehoon | - |
dc.contributor.googleauthor | Min, Piljae | - |
dc.contributor.googleauthor | Yi, Hyunbean | - |
dc.contributor.googleauthor | Park, Sungjin | - |
dc.sector.campus | E | - |
dc.sector.daehak | 소프트웨어융합대학 | - |
dc.sector.department | 소프트웨어학부 | - |
dc.identifier.pid | paksj | - |
dc.identifier.article | 4209941 | - |
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