Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성주 | - |
dc.date.accessioned | 2023-08-22T01:42:15Z | - |
dc.date.available | 2023-08-22T01:42:15Z | - |
dc.date.issued | 2010-07 | - |
dc.identifier.citation | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS, v. 57, NO. 7, article no. 5510052, Page. 561-565 | - |
dc.identifier.issn | 1549-7747;1558-3791 | - |
dc.identifier.uri | https://ieeexplore.ieee.org/document/5510052 | en_US |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/185659 | - |
dc.description.abstract | This brief presents a design-for-debug technique for a system-on-a-chip with multiple clock domains. We describe the debugging limitations that can exist between different clock domains when performing a scan-based debug methodology and then propose a scan cell and debug control logic to address those limitations. The proposed scan cell is designed to hold and shift the current or the previous state and support online debug. The debug control logic optimizes a core test infrastructure such as the IEEE 1500 test wrapper to minimize area overhead. | - |
dc.description.sponsorship | Manuscript received June 24, 2009; revised January 19, 2010; accepted March 23, 2010. Date of current version July 16, 2010. This work was supported by the Korea Research Foundation Grant funded by the Korean Government (Ministry of Education and Human Resource Development) under Grant KRF-2007-357-D00229. This paper was recommended by Associate Editor L. Lavagno. | - |
dc.language | en | - |
dc.publisher | IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC | - |
dc.subject | Design-for-debug (DfD) | - |
dc.subject | online debug | - |
dc.subject | scan-based debug | - |
dc.subject | scan design | - |
dc.subject | system-on-a-chip (SoC) debugging | - |
dc.title | A Scan Cell Design for Scan-Based Debugging of an SoC With Multiple Clock Domains | - |
dc.type | Article | - |
dc.relation.no | 7 | - |
dc.relation.volume | 57 | - |
dc.identifier.doi | 10.1109/TCSII.2010.2049923 | - |
dc.relation.page | 561-565 | - |
dc.relation.journal | IEEE TRANSACTIONS ON CIRCUITS AND SYSTEMS II-EXPRESS BRIEFS | - |
dc.contributor.googleauthor | Yi, Hyunbean | - |
dc.contributor.googleauthor | Kundu, Sandip | - |
dc.contributor.googleauthor | Cho, Sangwook | - |
dc.contributor.googleauthor | Park, Sungju | - |
dc.sector.campus | E | - |
dc.sector.daehak | 소프트웨어융합대학 | - |
dc.sector.department | 소프트웨어학부 | - |
dc.identifier.pid | paksj | - |
dc.identifier.article | 5510052 | - |
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