A 80x60 Micro-Bolometer CMOS Thermal Imager Integrated with a Low-Noise 12-Bit DAC
- Title
- A 80x60 Micro-Bolometer CMOS Thermal Imager Integrated with a Low-Noise 12-Bit DAC
- Author
- 이병훈
- Keywords
- Calibration; CMOS thermal imager; Computer architecture; Digital-to-analog converter (DAC); Integrated circuits; Linearity; Micro-bolometer; Microprocessors; NETD; Thermal noise; Voltage measurement
- Issue Date
- 2022-08
- Publisher
- IEEE-INST ELECTRICAL ELECTRONICS ENGINEERS INC
- Citation
- IEEE TRANSACTIONS ON INDUSTRIAL ELECTRONICS, v. 69, NO. 8, Page. 8604-8608
- Abstract
- A low-cost 80x60 micro-bolometer CMOS thermal imager is presented. The imager system integrated with a proposed 12-bit biasing digital-to-analog converter (DAC) has 100 ms start-up time, which is 300x faster than commercial products, while ensuring comparable 100 mK noise-equivalent temperature difference (NETD). The low-noise biasing DAC adopts a current-mode divider- stacking structure and a bit-inversion technique, leading to mismatch-insensitive operation. The 12-bit biasing DAC in a 0.18 m CMOS imager IC has a low noise of 1.89 Vrms and INL/DNL of 0.14/0.09 LSB, respectively.
- URI
- https://ieeexplore.ieee.org/document/9531418https://repository.hanyang.ac.kr/handle/20.500.11754/178026
- ISSN
- 0278-0046;1557-9948
- DOI
- 10.1109/TIE.2021.3109542
- Appears in Collections:
- COLLEGE OF ENGINEERING[S](공과대학) > ELECTRICAL AND BIOMEDICAL ENGINEERING(전기·생체공학부) > Articles
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