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Origin of p-Type Conduction in Amorphous CuI: A First-Principles Investigation

Title
Origin of p-Type Conduction in Amorphous CuI: A First-Principles Investigation
Author
정재경
Keywords
amorphous p-type semiconductors; cuprous iodide; density functional theory; high mobilities
Issue Date
2020-09
Publisher
WILEY-V C H VERLAG GMBH
Citation
PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS, v. 257, no. 9, article no. 2000218
Abstract
Recently, Jun et al. (Adv. Mater.2018,30, 1706573) reported Sn-doped amorphous phases of CuI (a-CuI) as a new class of transparent p-type semiconductors. It is surprising that high mobilities are found despite amorphous structures tend to localize carriers, particularly the directional p orbitals of anions. To reveal the microscopic origin of the new p-type amorphous semiconductors, density functional theory calculations are performed, and structural and electrical properties ofa-CuI are investigated. Amorphous models from melt-quench simulations consist of structural motifs that resemble local orders in crystalline polymorphs of CuI. Despite the absence of translational symmetry, states at valence band maximum (VBM) are substantially extended in linear ways due to the hybridization between I-5p states, explaining the high hole mobilities in the experiment. Sn-dopeda-CuI is also investigated and it is found that Sn atoms stabilize the amorphous structure without disturbing the hole transport. Furthermore, results on nonstoichiometric models show that Cu-deficiency increases the hole concentration ina-CuI and also enhances the delocalization of VBM states, which is consistent with the experimental observation that the hole mobility increases with doping concentrations. Herein, the origin of hole conduction in amorphous CuI is enlightened, which is believed to contribute in the development of high-performance p-type amorphous materials.
URI
https://onlinelibrary.wiley.com/doi/10.1002/pssb.202000218https://repository.hanyang.ac.kr/handle/20.500.11754/170921
ISSN
0370-1972; 1521-3951
DOI
10.1002/pssb.202000218
Appears in Collections:
COLLEGE OF ENGINEERING[S](공과대학) > ELECTRONIC ENGINEERING(융합전자공학부) > Articles
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