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dc.contributor.author정문석-
dc.date.accessioned2022-05-03T01:48:03Z-
dc.date.available2022-05-03T01:48:03Z-
dc.date.issued2020-09-
dc.identifier.citationAPPLIED SURFACE SCIENCE, v. 536, article no. 147990en_US
dc.identifier.issn0169-4332-
dc.identifier.issn1873-5584-
dc.identifier.urihttps://www.sciencedirect.com/science/article/pii/S0169433220327471?via%3Dihub-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/170514-
dc.description.abstractReduced graphene oxide (rGO) is a graphene-like material that exhibits high productivity for a wide range of industrial applications. To promote the application of rGO, it is important to not only produce high-quality rGO but also precisely evaluate the output. The intensity ratio of the D to G band in the Raman scattering is commonly used to assess the defect density of the carbon materials; however, this ratio is limited to evaluate the reduction degree of rGO because of the ambiguity arising from the superposition of the bands. In this study, we investigate the relationship between the intensity ratio of D* to G band and the reduction of graphene oxide (GO) to evaluate the degree of reduction of rGO. The spectral analysis of GO and rGO, along with systematic research of the thermally reduced GO synthesized via thermal treatment (100-900 degrees C) revealed a strong linkage between the D*/G intensity ratio and the C/O atomic ratio. The atomic vibrational relationships were elucidated by the assignment of the D* band, based on the density functional perturbation theory calculations. These findings explain the atomic vibrational properties of rGO and provide an indicator of the quality of rGO to optimize its performance for applications.en_US
dc.description.sponsorshipThis work was supported by the Nano Material Technology Development Program (No. 2016M3A7B6908929) of the National Research Foundation (NRF) funded by the Ministry of Science and ICT, the Development of Measurement Standards and Technology for Biomaterials and Medical Convergence funded by the Korea Research Institute of Standards and Science (KRISS - 2020 - GP2020-0004), and the Technology Innovation Program (20002486) funded by the Ministry of Trade, Industry & Energy (MOTIE, Korea).en_US
dc.language.isoenen_US
dc.publisherELSEVIERen_US
dc.subjectRaman spectroscopyen_US
dc.subjectReduced graphene oxideen_US
dc.subjectThermal reductionen_US
dc.subjectDensity functional perturbation theoryen_US
dc.titleRaman study of D* band in graphene oxide and its correlation with reductionen_US
dc.typeArticleen_US
dc.identifier.doi10.1016/j.apsusc.2020.147990-
dc.relation.journalAPPLIED SURFACE SCIENCE-
dc.contributor.googleauthorLee, A. Young-
dc.contributor.googleauthorYang, Kihyuk-
dc.contributor.googleauthorAnh, Nguyen Duc-
dc.contributor.googleauthorPark, Chulho-
dc.contributor.googleauthorLee, Seung Mi-
dc.contributor.googleauthorLee, Tae Geol-
dc.contributor.googleauthorJeong, Mun Seok-
dc.relation.code2020054238-
dc.sector.campusS-
dc.sector.daehakCOLLEGE OF NATURAL SCIENCES[S]-
dc.sector.departmentDEPARTMENT OF PHYSICS-
dc.identifier.pidmjeong-
dc.identifier.researcherIDB-1128-2013-
dc.identifier.orcidhttps://orcid.org/0000-0002-7019-8089-
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COLLEGE OF NATURAL SCIENCES[S](자연과학대학) > PHYSICS(물리학과) > Articles
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