Full metadata record
DC Field | Value | Language |
---|---|---|
dc.contributor.author | 박성주 | - |
dc.date.accessioned | 2022-04-10T23:53:30Z | - |
dc.date.available | 2022-04-10T23:53:30Z | - |
dc.date.issued | 2021-11 | - |
dc.identifier.citation | IEICE ELECTRONICS EXPRESS; NOV 15 2021, 5p. | en_US |
dc.identifier.issn | 13492543 | - |
dc.identifier.uri | https://www.jstage.jst.go.jp/article/elex/18/24/18_18.20210451/_article | - |
dc.identifier.uri | https://repository.hanyang.ac.kr/handle/20.500.11754/169836 | - |
dc.description.abstract | Logic BIST is a safety mechanism, which performs testing for Automotive electronics. However, pseudorandom LBIST patterns results in increased test time and test power. In this letter, a novel time multiplexed LBIST is presented to overcome test related problems of AI accelerators. First, the accelerator array is divided into smaller sub arrays, which are tested on time multiplexed clock cycles. This: 1) improves overall test time, under the given test power limit, 2) allows reduction in shift power, under given test time limits and 3) since only one sub array is clocked at a time, the peak power is reduced. | en_US |
dc.description.sponsorship | This work was supported in part by the Higher Education Commission, Govt. of Pakistan, under the scholarship program titled “Faculty Development of UESTPs/UETs”. This research was also supported by the BK21 FOUR (Fostering Outstanding Universities for Research) funded by the Ministry of Education (MOE, Korea) and National Research Foundation of Korea (NRF). | en_US |
dc.language.iso | en | en_US |
dc.publisher | IEICE-INST ELECTRONICS INFORMATION COMMUNICATIONS ENG | en_US |
dc.subject | Artificial Intelligence (AI) accelerators | en_US |
dc.subject | Automotives | en_US |
dc.subject | built-in self-test (BIST) | en_US |
dc.subject | test | en_US |
dc.subject | time multiplexed | en_US |
dc.title | Time Multiplexed LBIST for in-field testing of Automotives AI Accelerators | en_US |
dc.type | Article | en_US |
dc.identifier.doi | 10.1587/elex.18.20210451 | - |
dc.relation.page | 96700-96704 | - |
dc.relation.journal | IEICE ELECTRONICS EXPRESS | - |
dc.contributor.googleauthor | Solangi, Umair Saeed | - |
dc.contributor.googleauthor | Ibtesam, Muhammad | - |
dc.contributor.googleauthor | Park, Sungju | - |
dc.relation.code | 2021001322 | - |
dc.sector.campus | E | - |
dc.sector.daehak | COLLEGE OF COMPUTING[E] | - |
dc.sector.department | SCHOOL OF COMPUTER SCIENCE | - |
dc.identifier.pid | paksj | - |
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