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dc.contributor.author박성주-
dc.date.accessioned2021-05-17T05:00:46Z-
dc.date.available2021-05-17T05:00:46Z-
dc.date.issued2000-01-
dc.identifier.citation전자공학회논문지-SD, v. 37, no. 4, page. 71-79en_US
dc.identifier.issn1229-6368-
dc.identifier.urihttps://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE00404747-
dc.identifier.urihttps://repository.hanyang.ac.kr/handle/20.500.11754/162134-
dc.description.abstractThe original March algorithms cannot detect CMOS ADOFstAddress Decoder Open Faults) which requires separate deterministic test patterns Modified March algorithm using DOFtDegree of Freedom) was suggested to detect these faults in addition to conventional stuck faults. This paper augments the modified march test to further capture NPSFs(Neighborhood Pattern Sensitive Faults). Complete CA(Cellular Automata) is used for address generation and R I—LFSRs(Randomly Inversed LFSRs) for data generation A new modified March algorithm can detect SAF, CF,TF, CMOS ADOFs, and part of NPSFs. Time complexity of this algorithm is still Otn)en_US
dc.language.isoko_KRen_US
dc.publisher대한전자공학회en_US
dc.subjectMemory testen_US
dc.subjectMarch Alogorithmen_US
dc.subjectCMOS ADOFen_US
dc.subjectNPSFen_US
dc.subjectDOFen_US
dc.titleNPSFs를 고려한 수정된 March 알고리즘en_US
dc.title.alternativeModified March Algorithm considering NPSFsen_US
dc.typeArticleen_US
dc.relation.journal전자공학교육연구회지-
dc.contributor.googleauthor김태형-
dc.contributor.googleauthor윤수문-
dc.contributor.googleauthor박성주-
dc.relation.code2012101085-
dc.sector.campusE-
dc.sector.daehakCOLLEGE OF COMPUTING[E]-
dc.sector.departmentDIVISION OF COMPUTER SCIENCE-
dc.identifier.pidpaksj-
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