P1500 compliant Microcode-based Memory BIST for Testing of Embedded Memory

Abstract

A new microcode-based BIST(Built-In Self Test) module for embedded memory components is proposed in this paper. The microcode-based memory BIST proposed lends itself to performing different combinations of march and retention tests with less microcode storage than the other approaches. Furthermore, it is shown that the BIST module defines a BIST wrapper allowing its interface with a TAP controller, and allows to test multiple cores in the same chip can be tested through a TAP controller while complying with the PI 500 draft standard for embedded core test.