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Microcode-Based Memory BIST Implementing Modified March Algorithms

Title
Microcode-Based Memory BIST Implementing Modified March Algorithms
Author
박성주
Issue Date
2002-04
Publisher
KOREAN PHYSICAL SOC(한국물리학회)
Citation
Proceedings 10th Asian Test Symposium, page. 391-395
Abstract
A new microcode-based BIST (built-in self test) circuitry for embedded memory components is proposed in this paper. The memory BIST implements march algorithms which are slightly modified by adopting degree of freedom concept to detect address decoder open faults on top of conventional stuck faults. Furthermore, it is shown that the BIST-modified march can capture a few neighborhood pattern sensitive faults coupled with the cellular automata address generator and patterns. The proposed microcode-based memory BIST lends itself to performing different combinations of march and retention tests with less microcode storage than the other approaches.
URI
https://ieeexplore.ieee.org/document/990315?arnumber=990315&SID=EBSCO:edseeehttps://repository.hanyang.ac.kr/handle/20.500.11754/157301
ISBN
0-7695-1378-6
ISSN
1081-7735
DOI
10.1109/ATS.2001.990315
Appears in Collections:
ETC[S] > 연구정보
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