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100nm NIST 표준입자를 이용한 미분형 전기이동도 분석기의 교정 및 불확실도 측정

Title
100nm NIST 표준입자를 이용한 미분형 전기이동도 분석기의 교정 및 불확실도 측정
Other Titles
Calibration and Uncertainty Measurement of Differential Mobility Analyzer Using 100 nm NIST SRM 1963
Author
안강호
Keywords
Differential Mobility Analyzer; Uncertainty; Standard Reference Material; Electrical Mobility; 미분형 전기 이동도 분석기(DMA); 불확실도; 표준입자(SRM); 전기 이동도
Issue Date
2003-12
Publisher
대한기계학회
Citation
대한기계학회논문집 B권, v. 27, no. 12, page. 1766-1771
Abstract
House made differential mobility analyzer(DMA) is calibrated with NIST SRM 1691(300 nm PSL) . Then the particle size and uncertainty for differential mobility analyzer(DMA) using the NIST SRM 1963(100 nm PSL). In result, calibration of prototype DMA is measured using 300 nm NIST SRM 1691, then sheath air flow was corrected 126.67㎤ /s. Corrected sheath air flow is used in uncertainty measurement of prototype DMA. Uncertainty analysis is performed using NIST SRM 1963(100 nm PSL). The experimental result shows that NIST SRM 1963 is measured as 102.17 nm with a type A uncertainty of 0.33 nm.
URI
http://www.dbpia.co.kr/journal/articleDetail?nodeId=NODE00530795https://repository.hanyang.ac.kr/handle/20.500.11754/156556
ISSN
2288-5234; 1226-4881
Appears in Collections:
COLLEGE OF ENGINEERING SCIENCES[E](공학대학) > MECHANICAL ENGINEERING(기계공학과) > Articles
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